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Test configurations

Profilometry (3D)

Historically, profilometry was acknowledged as a graph of the surface height as the surface is moved relative to the contact profilometer's stylus (skating on the surface). This notion is changing with the emergence of numerous non-contact (optical) profilometry techniques, where surface height is mapped on a XY grid (e.g. through laser beam triangulation). Using a multiaxial mechanical tester, a similar non-destructive characterization can be performed by scanning the surface with series of very light contacts with the surface. At each location, a small spherical indenter is lowered against the surface until a predefined load is detected by the load cell (as low as few uN). The vertical position of the indenter at the first contact detection is the local height of the surface. Depending of the tester specifications, a submicron resolution can be achieved on samples with a wide range of stiffness (few kPa to hundreds of GPa). This technique is not influenced by optical artifacts and can be performed with the sample bathing in a solution.

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