Mark G. T. Begonia; Jun Liao; Mark F. Horstemeyer; Lakiesha N. Williams
Paper presented at the ASME 2009 Summer Bioengineering Conference. (2009)
https://doi.org/10.1115/sbc2009-206371
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Les titres, résumés et légendes des publications sont présentés en anglais.
This study examines the internal microstructure evolution of porcine brain during mechanical deformation. Strain rate dependency of porcine brain was investigated under quasi-static compression for strain rates of 0.00625, 0.025, and 0.10 s(-1). Confocal microscopy was employed at 15, 30, and 40% strain to quantify microstructural changes, and image analysis was implemented to calculate the area fraction of neurons and glial cells. The nonlinear stress-strain behavior exhibited a viscoelastic response from the strain rate sensitivity observed, and image analysis revealed that the mean area fraction of neurons and glial cells increased according to the applied strain level and strain rate. The area fraction for the undamaged state was 7.85 +/- 0.07%, but at 40% strain thevalues were 11.55 +/- 0.35%, 13.30 +/- 0.28%, and 19.50 +/- 0.14% for respective strain rates of 0.00625, 0.025, and 0.10 s(-1). The increased area fractions were a function of the applied strain rate and were attributed to the compaction of neural constituents and the stiffening tissue response. The microstructural variations in the tissue were linked to mechanical properties at progressive levels of compression in order to generate structure-property relationships useful for refining current FE material models.
Utilisation des équipements
Du tissu cérébral porcin a été étudié en compression quasi statique afin de relier le comportement mécanique dépendant de la vitesse de déformation aux changements microstructuraux. La microscopie confocale et l’analyse d’images ont quantifié la fraction surfacique des neurones et des cellules gliales. Le résumé disponible n’identifie pas l’appareil de compression ni les conditions de confinement; l’utilisation du Mach-1 Mechanical Tester reste non vérifiée.
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